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IEEE Design & Test

About:

IEEE Design & Test journal offers original works describing the models, methods and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies.

Journal Home:  Journal Homepage
Editor-in-Chief:  Joerg Henkel
scope:

EEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software.

Print ISSN:

Print ISSN:  2168-2356

Electronic ISSN:  2168-2364

Abstracting and Indexing:  Science Citation Index Expanded. Scopus.
Imapct Factor 2020:  2.409
Subject Area and Category:  Computer Sciences, Electronics and Telecommunications, Industrial Engineering
Publication Frequency:  Bimonthly
H Index:  79
Best Quartile:

Q1:  

Q2:  Software

Q3:  

Q4:  

Journal Home:  Journal Homepage
Cite Score:  4.8
SNIP:  1.6219999999999999
Journal Rank(SJR):  0.35
Guidelines for Authors:

IEEE Design & Test Author Guidelines

Publisher & Country:

Publisher:  Institute of Electrical and Electronics Engineers

Country:  United States