IEEE Design & Test journal offers original works describing the models, methods and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies.
Journal Home: Journal Homepage
Editor-in-Chief: Joerg Henkel
scope: EEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software.
Print ISSN: 2168-2356
Electronic ISSN: 2168-2364
Abstracting and Indexing: Science Citation Index Expanded. Scopus.
Imapct Factor 2021: 2.223
Subject Area and Category: Computer Sciences, Electronics and Telecommunications, Industrial Engineering
Publication Frequency: Bimonthly
H Index: 80
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Q3: Software
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Cite Score: 3.3
SNIP: 0.962
Journal Rank(SJR): 0.597
Latest Articles: Latest Articles in IEEE Design & Test
Guidelines for Authors: IEEE Design & Test Author Guidelines
Paper Submissions: Paper Submissions in IEEE Design & Test
Publisher: Institute of Electrical and Electronics Engineers
Country: United States
