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IEEE Transactions on Reliability


IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines such as physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness.

Journal Home:  Journal Homepage
Editor-in-Chief:  W. Eric Wong

The Society is concerned with the problems involved in attaining reliability, maintaining it through the life of the system or device, and measuring it. The Society is engaged in the engineering disciplines of hardware, software, and human factors.

Print ISSN:

Print ISSN:  0018-9529

Electronic ISSN:   1558-1721

Abstracting and Indexing:  Science Citation Index Expanded. Scopus.
Imapct Factor 2020:  4.424
Subject Area and Category:  Electronics and Telecommunications, Industrial Engineering
Publication Frequency:  Quarterly
H Index:  102
Best Quartile:

Q1:  Safety, Risk, Reliability and Quality




Journal Home:  Journal Homepage
Cite Score:  7.7
SNIP:  2.122
Journal Rank(SJR):  1.032
Publisher & Country:

Publisher:  IEEE Reliability Society

Country:  USA