IEEE Design & Test journal offers original works describing the models, methods and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies.
Journal Home:  Journal Homepage
Editor-in-Chief:  Joerg Henkel
scope: EEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software.
Print ISSN:  2168-2356
Electronic ISSN:  2168-2364
Abstracting and Indexing:  Science Citation Index Expanded. Scopus.
Imapct Factor 2021:  2.223
Subject Area and Category:  Computer Sciences, Electronics and Telecommunications, Industrial Engineering
Publication Frequency:  Bimonthly
H Index:  80
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Q3:  Software
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Cite Score:  3.3
SNIP:  0.962
Journal Rank(SJR):  0.597
Latest Articles:   Latest Articles in IEEE Design & Test
Guidelines for Authors: IEEE Design & Test Author Guidelines
Paper Submissions: Paper Submissions in IEEE Design & Test
Publisher:  Institute of Electrical and Electronics Engineers
Country:  United States