About:

EEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies.

Journal Home:  Journal Homepage

Editor-in-Chief:  Jorg Henkel

scope:

Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.

Print ISSN:

Print ISSN:  21682356

Electronic ISSN:  

Abstracting and Indexing:  Scopus Science Citation Index Expanded

Imapct Factor 2020:  1.527

Subject Area and Category:   Computer Science Hardware and Architecture Software Engineering Electrical and Electronic Engineering

Publication Frequency:  

H Index:  79

Best Quartile:

Q1:  

Q2:  

Q3:  Software

Q4:  

Journal Home:  Journal Homepage

Cite Score:  4.2

SNIP:  1.244

Journal Rank(SJR):  0.35

Latest Articles:  

Latest Articles in IEEE Design and Test

Guidelines for Authors:

IEEE Design and Test Author Guidelines

Paper Submissions:

Paper Submissions in IEEE Design and Test

Publisher & Country:

Publisher:  IEEE Computer Society

Country:  United States