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Epileptic seizure detection using fuzzy-rules-based sub-band specific features and layered multi-class SVM - 2019

Epileptic Seizure Detection Using Fuzzy-Rules-Based Sub-Band Specific Features And Layered Multi-Class Svm

Research Area:  Machine Learning


In this paper, a new epileptic seizure detection method using fuzzy-rules-based sub-band specific features and layered directed acyclic graph support vector machine (LDAG-SVM) is proposed for classification of electroencephalogram (EEG) signals. Wavelet transformation is used to decompose the input EEG signals into various sub-bands. The nonlinear features, namely approximate entropy, largest Lyapunov exponent and correlation dimension, are extracted from each sub-band. In this proposed work, sub-band specific feature subset that is reduced in size and capable of discriminating samples is selected by employing fuzzy rules. For classification purpose, a new LDAG-SVM is used for detecting epileptic seizure. Every sub-band has its own characteristics. If appropriate features which characterize the specific sub-band are selected, then the classification accuracy is improved and computational complexity is reduced. The important advantage of the fuzzy logic is its close relation to human thinking. Due to the lengthy record and intra-professional variability, automation of epileptic detection is inevitable. Fuzzy rules are the natural choice of employing human expertise to build machine learning system. Performances of the proposed methods are evaluated using two different benchmark EEG datasets, namely Bonn and CHB-MIT. The performance measures such as classification accuracy, sensitivity, specificity, execution time and receiver operating characteristics are used to measure and analyze the performances of the proposed classifier. The proposed LDAG-SVM with fuzzy-rules-based selected sub-band specific features provides better performance in terms of improved classification accuracy with reduced execution time compared to existing methods.


Author(s) Name:  S. Ramakrishnan & A. S. Muthanantha Murugavel

Journal name:  Pattern Analysis and Applications

Conferrence name:  

Publisher name:  Springer

DOI:  10.1007/s10044-018-0691-6

Volume Information:  volume 22, pages1161–1176 (2019)