Amazing technological breakthrough possible @S-Logix

Office Address

  • 2nd Floor, #7a, High School Road, Secretariat Colony Ambattur, Chennai-600053 (Landmark: SRM School) Tamil Nadu, India
  • +91- 81240 01111

Social List

Salient Object Detection in the Deep Learning Era: An In-Depth Survey - 2021

Salient Object Detection In The Deep Learning Era: An In-Depth Survey

Survey Paper on Salient Object Detection In The Deep Learning Era

Research Area:  Machine Learning


As an essential problem in computer vision, salient object detection (SOD) has attracted an increasing amount of research attention over the years. Recent advances in SOD are predominantly led by deep learning-based solutions (named deep SOD). To enable in-depth understanding of deep SOD, in this paper, we provide a comprehensive survey covering various aspects, ranging from algorithm taxonomy to unsolved issues. In particular, we first review deep SOD algorithms from different perspectives, including network architecture, level of supervision, learning paradigm, and object-/instance-level detection. Following that, we summarize and analyze existing SOD datasets and evaluation metrics. Then, we benchmark a large group of representative SOD models, and provide detailed analyses of the comparison results. Moreover, we study the performance of SOD algorithms under different attribute settings, which has not been thoroughly explored previously, by constructing a novel SOD dataset with rich attribute annotations covering various salient object types, challenging factors, and scene categories. We further analyze, for the first time in the field, the robustness of SOD models to random input perturbations and adversarial attacks. We also look into the generalization and difficulty of existing SOD datasets. Finally, we discuss several open issues of SOD and outline future research directions.

Salient Object Detection
Deep Learning
Machine Learning

Author(s) Name:  Wenguan Wang; Qiuxia Lai; Huazhu Fu; Jianbing Shen; Haibin Ling; Ruigang Yang

Journal name:  IEEE Transactions on Pattern Analysis and Machine Intelligence

Conferrence name:  

Publisher name:  IEEE

DOI:  10.1109/TPAMI.2021.3051099

Volume Information:  Volume: 44, Issue: 6, 01 June 2022, Page(s): 3239 - 3259